Påvisande och kvantitativ mätning av grundämnen utifrån det faktum att den röntgenstrålning som avges av ett grundämne som aktiveras av en elektronstråle har en för ämnet karakteristisk våglängd och mängdintensitet. Tekniken kan utnyttjas i elektronmikrosond, mikroanalyselektronmikroskop, eller elektronmikroskop eller svepelektronmikroskop utrustade med röntgenspektrometer.
Identification and measurement of ELEMENTS and their location based on the fact that X-RAYS emitted by an element excited by an electron beam have a wavelength characteristic of that element and an intensity related to its concentration. It is performed with an electron microscope fitted with an x-ray spectrometer, in scanning or transmission mode.
XRMA — Röntgenmikroanalys
Electron Probe Microanalyses — Microanalyses, Electron Probe — Probe Microanalyses, Electron — Probe Microanalysis, Electron — Microscopy, Electron, X-Ray Microanalysis — Spectrometry, X Ray Emission, Electron Microscopic — Spectrometry, X Ray Emission, Electron Probe — Spectrometry, X-Ray Emission, Electron Microscopic — X-Ray Microanalysis, Electron Probe — X Ray Microanalysis, Electron Probe — X Ray Emission Spectrometry, Electron Microscopic — X Ray Emission Spectrometry, Electron Probe — X-Ray Emission Spectrometry, Electron Microscopic — X-Ray Emission Spectrometry, Electron Probe — X-Ray Microanalysis — Microanalysis, X-Ray — X Ray Microanalysis — X-Ray Microanalysis, Electron Microscopic — X Ray Microanalysis, Electron Microscopic — Microanalysis, Electron Probe — Spectrometry, X-Ray Emission, Electron Probe